The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 04, 2022

Filed:

Aug. 14, 2018
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Dzung Phan, Ossining, NY (US);

Matthew Menickelly, Downers Grove, IL (US);

Jayant R. Kalagnanam, Briarcliff Manor, NY (US);

Tsuyoshi Ide, Harrison, NY (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06N 7/02 (2006.01); G06F 11/30 (2006.01); G06N 5/00 (2006.01); G06N 20/00 (2019.01); G06F 16/901 (2019.01);
U.S. Cl.
CPC ...
G06N 7/02 (2013.01); G06F 11/3006 (2013.01); G06F 11/3089 (2013.01); G06F 16/9024 (2019.01); G06N 5/003 (2013.01); G06N 20/00 (2019.01);
Abstract

A first dependency graph is constructed based on a first data set by solving an objective function constrained with a maximum number of non-zeros and formulated with a regularization term comprising a quadratic penalty to control sparsity. The quadratic penalty in constructing the second dependency graph is determined as a function of the first data set. A second dependency graph is constructed based on a second data set by solving the objective function constrained with the maximum number of non-zeros and formulated with the regularization term comprising a quadratic penalty. The quadratic penalty in constructing the second dependency graph is determined as a function of the first data set and the second data set. An anomaly score is determined for each of a plurality of sensors based on comparing the first dependency graph and the second dependency graph, nodes of which represent sensors.


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