The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 04, 2022
Filed:
Apr. 14, 2020
Getac Technology Corporation, Hsinchu County, TW;
Kun-Yu Tsai, Taipei, TW;
GETAC TECHNOLOGY CORPORATION, Hsinchu County, TW;
Abstract
An image detection scanning method for object surface defects and an image detection scanning system thereof are provided. The method includes capturing a test image according to test light, determining whether the test image is normal, generating a coincidence signal if the test image is normal, coinciding the object with the detection position according to the coincidence signal, sequentially moving one of a plurality of areas on a surface of the object to the detection position, providing detection light facing the detection position, the detection light illuminating the detection position with a light incident angle of less than or equal to 90 degrees relative to a normal line of the area located at the detection position, and capturing a detection image of each of the areas sequentially located at the detection position according to the detection light after the object is coincided with the detection position.