The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 04, 2022

Filed:

Oct. 27, 2018
Applicant:

Sap SE, Walldorf, DE;

Inventors:

Stacy Chapman, San Francisco, CA (US);

Satish Sallakonda, Dublin, CA (US);

Arun Radhakrishnan, Fremont, CA (US);

Assignee:

SAP SE, Walldorf, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/00 (2019.01); G06F 16/242 (2019.01); G06F 9/54 (2006.01); G06F 16/25 (2019.01); G06F 16/335 (2019.01); G06F 40/279 (2020.01);
U.S. Cl.
CPC ...
G06F 16/244 (2019.01); G06F 9/54 (2013.01); G06F 16/25 (2019.01); G06F 16/337 (2019.01); G06F 40/279 (2020.01);
Abstract

A disparate data source aggregation system and methods are provided which may pull or retrieve talent data or features from disparate data sources, automatically correlate the data across the different data sources, build a self-adjusting system database that captures the talent data from the disparate data sources, and lets users search, query and build model insights on the aggregated data of the system database without human intervention. A method for disparate data source aggregation may include: extracting a first feature set having a first extracted feature and a second feature set having a second extracted feature; determining, if the first extracted feature of the first feature set matches the second extracted feature of the second feature set; and aggregating the first feature set with the second feature set if the first extracted feature of the first feature set matches the second extracted feature of the second feature set.


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