The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 04, 2022
Filed:
Jul. 31, 2018
Nutanix, Inc., San Jose, CA (US);
Hema Venkataramani, San Jose, CA (US);
Peter Scott Wyckoff, Durham, NC (US);
Nutanix, Inc., San Jose, CA (US);
Abstract
Systems and methods for iterative, high-performance, low-latency data replication. A method embodiment commences upon identifying one or more replica target nodes to receive replicas of working data. Steps of the method then compose at least one replication message. The replication message includes the location or contents of working data as well as a listing of downstream replica target nodes. The replication capacity is measured at the subject node. Based on the measured replication capacity, the subject node sends instructions in the replication message to one or more downstream replica target nodes. Any one or more of the downstream replica target nodes receives the instructions and iterates the steps of measuring its own capacity and determining the instructions, if any, to send to further downstream replica target nodes. Each replica target node replicates the working data. In some cases, the measured replication capacity is enough to perform all replications in parallel.