The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 04, 2022
Filed:
Mar. 02, 2020
Oracle International Corporation, Redwood Shores, CA (US);
Amit Vaid, Bengaluru, IN;
Karthik Gvd, Bengaluru, IN;
Vijayalakshmi Krishnamurthy, Sunnyvale, CA (US);
ORACLE INTERNATIONAL CORPORATION, Redwood Shores, CA (US);
Abstract
Embodiments determine anomalies in sensor data generated by a plurality of sensors that correspond to a single asset. Embodiments receive a first time window of clean sensor input data generated by the sensors, the clean sensor data including anomaly free data comprised of clean data points. Embodiments divide the clean data points into training data points and evaluation data points, and divide the training data points into a pre-defined number of plurality of segments of equal length. Embodiments convert each of the plurality of segments into corresponding segment curves using Kernel Density Estimation ('KDE') and determine a Jensen-Shannon ('JS') divergence value for each of the plurality of segments using the segment curves to generate a plurality of JS divergence values. Embodiments then assign the maximum value of the plurality of JS divergence values as a threshold value and validate the threshold value using the evaluation data points.