The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 04, 2022
Filed:
Dec. 04, 2017
The Regents of the University of Michigan, Ann Arbor, MI (US);
Kenn Oldham, Ann Arbor, MI (US);
Jongsoo Choi, Stoneham, MA (US);
Xiyu Duan, Ann Arbor, MI (US);
Thomas D. Wang, Ann Arbor, MI (US);
Haijun Li, Ann Arbor, MI (US);
THE REGENTS OF THE UNIVERSITY OF MICHIGAN, Ann Arbor, MI (US);
Abstract
A multi-photon optical probe includes a probe housing, a lateral scanning stage coupled to a lateral mirror assembly and a remote axial scanning stage coupled to an axial mirror assembly. The lateral scanning stage is adapted to scan output laser energy over a planar scan area of the sample by moving the lateral mirror assembly. The axial scanning stage is adapted to scan the output laser energy over a vertical depth range of the sample, which, combined with the planar scan area, forms a 3-dimensional volume. A controller operates in conjunction with a number of remote actuating legs coupled to the axial mirror assembly in order to provide level imaging plane which in turn provides for a clear scanned image.