The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 04, 2022
Filed:
Apr. 11, 2019
Smiths Heimann Gmbh, Wiesbaden, DE;
Karsten Burger, Wiesbaden, DE;
SMITHS HEIMANN GMBH, Wiesbaden, DE;
Abstract
The disclosure relates to a method for detecting a tampered metal item (FC), in which a non-metallic substance is concealed and which has been tampered with in such a way that the tampered metal item (FC) produces a two-dimensional X-ray image comparable to a corresponding non-tampered metal item, in two-dimensional X-ray data of an inspection object (O, O, O) containing the metal item (FC), the method including (S) determining a region containing a metal item (FC), (S) providing an attenuation curve (D(r)) for or intensity curve (I(r)) of detected X-ray radiation along a line (L) through said metal item (FC), (S) evaluating whether the attenuation curve (D(r)) or the intensity curve (I(r)) shows a characteristic anomaly (P, P) in a predetermined area, and when the attenuation curve (D(r)) or the intensity curve (I(r)) in the predetermined range shows the characteristic anomaly (P, P), (S) triggering an alarm function.