The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 04, 2022
Filed:
Mar. 30, 2017
Analogic Corporation, Peabody, MA (US);
Patrick Richard Splinter, Kingston, MA (US);
Steven Dana Weed, Marblehead, MA (US);
David Gino Vacca, Salem, NH (US);
Sevag Minas Zoboyan, Wakefield, MA (US);
Analogic Corporation, Peabody, MA (US);
Abstract
Among other things, one or more techniques and/or systems are described for setting a sampling frequency for a radiation imaging system. The radiation imaging system comprises a rotating gantry configured to rotate a radiation source and a detector array about an object to generate an image(s) of the object. A data acquisition system is configured to sample the detector array as views. One or more flag structures are arranged according to a partial arc segment (e.g., a structure less than a full 360 degree circle). One or more sensors are disposed on one of the rotating gantry or a stationary support about which the rotating gantry rotates. When a sensor encounters a flag structure, a current rotational speed of the rotating gantry is determined. A clock frequency is updated based upon the current rotational speed to establish a sampling frequency for the data acquisition system for sampling the detector array.