The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 04, 2022
Filed:
Jul. 01, 2016
Hitachi High-technologies Corporation, Tokyo, JP;
Roche Diagnostics Operations, Inc., Indianapolis, IN (US);
Kenta Imai, Tokyo, JP;
Toshiharu Suzuki, Tokyo, JP;
Shigeki Matsubara, Tokyo, JP;
Takayuki Sugime, Tokyo, JP;
Shunsuke Sasaki, Tokyo, JP;
Elke Faatz, Huglfing, DE;
Beatus Ofenloch-Haehnle, Polling, DE;
HITACHI HIGH-TECH CORPORATION, Tokyo, JP;
ROCHE DIAGNOSTICS OPERATIONS, INC., Indianapolis, IN (US);
Abstract
In conventional automatic analyzers, there have been instances where, when a plurality of associated items are analyzed as a set item, there is high variation in the analysis data obtained using the set item, leading to a need for improvement of analysis precision. The present invention comprises performing, in mutual association, a set of preparation steps to carry out until it is time to analyze an unknown sample, the set of preparation steps including a pre-preparation step in which stirring, etc., is performed when an analysis reagent kit is mounted on the analyzer, and a step for correcting a standard curve in which correction samples that correspond to analysis items are used. This makes it possible to perform analysis after the preparation states of a plurality of analysis reagent kits are collected as needed, enabling high-precision analysis of a set item.