The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 04, 2022
Filed:
May. 08, 2019
Tsinghua University, Beijing, CN;
Nuctech Company Limited, Beijing, CN;
Qingjun Zhang, Beijing, CN;
Yuanjing Li, Beijing, CN;
Zhiqiang Chen, Beijing, CN;
Ziran Zhao, Beijing, CN;
Yinong Liu, Beijing, CN;
Yaohong Liu, Beijing, CN;
Qiufeng Ma, Beijing, CN;
Lili Yan, Beijing, CN;
Weiping Zhu, Beijing, CN;
Biao Cao, Beijing, CN;
TSINGHUA UNIVERSITY, Beijing, CN;
NUCTECH COMPANY LIMITED, Beijing, CN;
Abstract
The present disclosure provides a gate system for sample detection and a method of sample inspection, which relate to the field of detection and analysis technology. The gate system comprises: an accommodating apparatus configured to accommodate an inserted ticket to be detected; a wipe sampling apparatus including a wipe sampling belt which is configured to drive the ticket to be detected to move within the accommodating apparatus and to conduct a wipe sampling to the ticket; an inspiratory sampling apparatus configured to collect samples dropped from the wipe sampling apparatus; and a detection apparatus configured to detect the samples and output detection results. The gate system for sample detection and the method of sample inspection provided by the present disclosure have a wide range of applications and can perform rapid sampling and detection to those substances that are difficult to be volatilized.