The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 04, 2022
Filed:
Mar. 25, 2019
Applicant:
Hitachi High-tech Science Corporation, Tokyo, JP;
Inventors:
Masahito Ito, Tokyo, JP;
Masato Fukuda, Tokyo, JP;
Assignee:
Hitachi High-Tech Science Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 30/88 (2006.01); G06F 17/18 (2006.01); G01N 30/86 (2006.01);
U.S. Cl.
CPC ...
G01N 30/88 (2013.01); G01N 30/8631 (2013.01); G01N 30/8641 (2013.01); G06F 17/18 (2013.01); G01N 30/8624 (2013.01); G01N 2030/8648 (2013.01); G01N 2030/8804 (2013.01);
Abstract
A chromatographic data system processing apparatus performs data processing based on plot data measured by a chromatograph. The chromatographic data system processing apparatus includes a virtual curve calculation portion which obtains a virtual curve based on the measured plot data, a tentative feature point acquisition portion which obtains a tentative feature point based on the obtained virtual curve, and an actual plot data feature point extraction portion which extracts an actual plot data feature point corresponding to the tentative feature point from the measured plot data.