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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 11215584 B1

PDFFull Text
Date of Patent:
Jan. 04, 2022

Filed:

Oct. 23, 2017

Material defect detection device, material defect detection system, material defect detection method, and non-transitory computer readable storage medium

Applicant:

Yokogawa Electric Corporation, Tokyo, JP;

Inventors:

Tetsuya Ishikawa, Tokyo, JP;

Hideki Yoshida, Tokyo, JP;

Assignee:

YOKOGAWA ELECTRIC CORPORATION, Tokyo, JP;

Attorney:

Osha Bergman Watanabe & Burton LLP

Primary Examiner:

Douglas X Rodriguez

Assistant Examiner:

Trung Q Nguyen

Int. Cl.
CPC ...
G01N 27/82 (2006.01); G01R 33/00 (2006.01); G01R 33/02 (2006.01); G01R 33/12 (2006.01);
U.S. Cl.
CPC ...
G01N 27/82 (2013.01); G01R 33/0094 (2013.01); G01R 33/02 (2013.01); G01R 33/1215 (2013.01);
Abstract

A material defect detection device that detects a material defect in a predetermined region of metallic equipment using a magnetic field distribution in the predetermined region measured by a magnetic sensor array including a plurality of magnetic sensors, the material defect detection device including: a processor that calculates a density distribution of magnetic dipoles in the predetermined region based on the magnetic field distribution and calculates a depth distribution of material defect in the predetermined region based on the density distribution of the magnetic dipoles.

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Ishikawa, Tetsuya. (2022). Material defect detection device, material defect detection system, material defect detection method, and non-transitory computer readable storage medium (U.S. Patent No. 11215584). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11215584

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