The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 04, 2022
Filed:
Oct. 23, 2017
Applicant:
Yokogawa Electric Corporation, Tokyo, JP;
Inventors:
Tetsuya Ishikawa, Tokyo, JP;
Hideki Yoshida, Tokyo, JP;
Assignee:
YOKOGAWA ELECTRIC CORPORATION, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 27/82 (2006.01); G01R 33/00 (2006.01); G01R 33/02 (2006.01); G01R 33/12 (2006.01);
U.S. Cl.
CPC ...
G01N 27/82 (2013.01); G01R 33/0094 (2013.01); G01R 33/02 (2013.01); G01R 33/1215 (2013.01);
Abstract
A material defect detection device that detects a material defect in a predetermined region of metallic equipment using a magnetic field distribution in the predetermined region measured by a magnetic sensor array including a plurality of magnetic sensors, the material defect detection device including: a processor that calculates a density distribution of magnetic dipoles in the predetermined region based on the magnetic field distribution and calculates a depth distribution of material defect in the predetermined region based on the density distribution of the magnetic dipoles.