The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 04, 2022
Filed:
Dec. 26, 2019
Shenzhen Institute of Terahertz Technology and Innovation Co., Ltd., Guangdong, CN;
Shenzhen Institute of Terahertz Technology and Innovation, Guangdong, CN;
SHENZHEN INSTITUTE OF TERAHERTZ TECHNOLOGY AND INNOVATION CO., LTD., Guangdong, CN;
SHENZHEN INSTITUTE OF TERAHERTZ TECHNOLOGY AND INNOVATION, Guangdong, CN;
Abstract
A terahertz spectrum test device and system includes a femtosecond fiber laser configured to generate a pump light and a probe light. The pump light excites a terahertz transmitter to generate terahertz waves which are transmitted to a sample suspension device to irradiate a suspended to-be-tested sample, and the probe light is directly transmitted to a terahertz detector. The terahertz detector receives the terahertz waves transmitted from the sample suspension device, and then transmits the terahertz waves and the probe light together to a signal processing circuit to obtain a corresponding terahertz time-domain spectrum. By adoption of the terahertz spectrum test device and system, the to-be-tested sample need not be fixed with a clamp or other instruments, so that terahertz waves will not irradiate to the instrument used for fixing the to-be-tested sample during a terahertz spectrum test, which may otherwise affect the test result.