The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 04, 2022

Filed:

Oct. 17, 2018
Applicant:

Kyoto University, Kyoto, JP;

Inventors:

Takeshi Hasegawa, Kyoto, JP;

Nobutaka Shioya, Kyoto, JP;

Assignee:

KYOTO UNIVERSITY, Kyoto, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 3/447 (2006.01); G01N 21/27 (2006.01); G01N 21/66 (2006.01); G01N 21/84 (2006.01);
U.S. Cl.
CPC ...
G01J 3/447 (2013.01); G01N 21/27 (2013.01); G01N 21/66 (2013.01); G01N 21/8422 (2013.01);
Abstract

A spectral analysis device includes a light source, a support body, a linear polarization filter, a detection unit, a regression computation unit, and an absorbance spectrum calculation unit. The support body is fixed such that an incident angle of the light is a predetermined incident angle θ. The linear polarization filter is configured such that lights with polarization angles ϕranging from 0° to 90° are irradiated to the support body. The detection unit detects a transmitted spectrum S from transmitted lights with the polarization angles ϕ. The regression computation unit obtains an in-plane spectrum sand an out-of-plane spectrum sthrough regression analysis by using the transmitted spectrum S and a mixing ratio R. The absorbance spectrum calculation unit calculates an in-plane absorbance spectrum Aand an out-of-plane absorbance spectrum Aof the thin film based on the in-plane spectrum and the out-of-plane spectrum.


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