The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 04, 2022

Filed:

Aug. 28, 2018
Applicant:

Leica Microsystems Cms Gmbh, Wetzlar, DE;

Inventors:

Holger Birk, Meckesheim, DE;

Bernd Widzgowski, Dossenheim, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 1/44 (2006.01); G02B 21/00 (2006.01);
U.S. Cl.
CPC ...
G01J 1/44 (2013.01); G02B 21/0096 (2013.01); G01J 2001/442 (2013.01); G01J 2001/444 (2013.01); G01J 2001/4446 (2013.01);
Abstract

A method for counting photons using a photomultiplier includes obtaining a measurement signal from a raw signal produced by the photomultiplier by correcting the raw signal for a noise signal and/or an offset, wherein an incident photon produces a pulse in the raw signal. The measurement signal is integrated over time to form an analog integrated measurement signal. A number of photons that are incident in the photomultiplier is ascertained by comparing a value of the analog integrated measurement signal to an integral proportionality value which corresponds to a specific number of photons incident in the photomultiplier.


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