The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 04, 2022

Filed:

Jul. 01, 2020
Applicant:

Keyence Corporation, Osaka, JP;

Inventor:

Kazuki Natori, Osaka, JP;

Assignee:

KEYENCE CORPORATION, Osaka, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/25 (2006.01);
U.S. Cl.
CPC ...
G01B 11/254 (2013.01); G01B 11/2522 (2013.01);
Abstract

A three-dimensional shape measuring apparatus includes a photoreceptor that receives measuring light which is reflected by a workpiece illuminated by an illuminator, and provides light-reception signals representing a light reception amount; and a processor that generates a set of shape data representing three-dimensional shape of a part of the workpiece which is included in the field of view at a particular position of the stage based on the signals, repeats movement of the stage by using a movement controller based on the generated data corresponding to the part of the workpiece to obtain a set of data corresponding to other part of the workpiece which is located in proximity to the part of the workpiece and the generation of a set of data of the workpiece at the position where the stage is moved, and generates combined data including the entire shape of the workpiece by combining the repeatedly obtained sets of data.


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