The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 04, 2022
Filed:
Apr. 05, 2018
Applicant:
Nippon Shokubai Co., Ltd., Osaka, JP;
Inventors:
Assignee:
NIPPON SHOKUBAI CO., LTD., Osaka, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C01B 33/187 (2006.01); C08K 3/36 (2006.01); C08K 9/04 (2006.01); C09C 1/30 (2006.01);
U.S. Cl.
CPC ...
C01B 33/187 (2013.01); C08K 3/36 (2013.01); C08K 9/04 (2013.01); C09C 1/3063 (2013.01); C01P 2004/04 (2013.01); C01P 2004/64 (2013.01); C01P 2006/12 (2013.01); C08K 2201/005 (2013.01); C08K 2201/006 (2013.01); C08K 2201/011 (2013.01);
Abstract
The object of the present invention is to provide silica particles which can provide a silica particle dispersion exhibiting excellent uniformity. The present invention is silica particles having an average primary particle diameter dcalculated from a specific surface area by a BET method of 1 nm or more and 100 nm or less and a ratio (d/d) of an average secondary particle diameter dmeasured by a dynamic light scattering method to the dof 1.2 or less. The silica particles of the present invention preferably have a coefficient of variation in a particle diameter measured using a transmission electron microscope at a magnification of 200,000 of 20% or less.