The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 04, 2022

Filed:

Oct. 17, 2019
Applicant:

Ckd Corporation, Aichi, JP;

Inventors:

Yukihiro Taguchi, Aichi, JP;

Tsuyoshi Ohyama, Aichi, JP;

Norihiko Sakaida, Aichi, JP;

Assignee:

CKD CORPORATION, Aichi, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B65B 57/10 (2006.01); B65B 47/04 (2006.01); B65B 9/04 (2006.01); G01N 21/27 (2006.01); G01N 21/359 (2014.01);
U.S. Cl.
CPC ...
B65B 57/10 (2013.01); B65B 9/045 (2013.01); B65B 47/04 (2013.01); G01N 21/27 (2013.01); G01N 21/359 (2013.01);
Abstract

An inspection device includes: an irradiator that irradiates an object with near-infrared light; a spectroscope that disperses reflected light from the irradiated object; an imaging device that takes a spectroscopic image of the reflected light; a processor that: obtains spectral data of a plurality of points on the object, based on the spectroscopic image; defines a group of similar spectral data from among the spectral data of the plurality of points; extracts a group having a largest number of spectral data from the defined group; calculates an average of the spectral data of the extracted group; and detects a type of the object using a predetermined analysis of the object, based on the average.


Find Patent Forward Citations

Loading…