Method for classifying light-emitting semiconductor components and image sensor application having an image sensor and a semiconductor element

Abstract

The invention relates to a method for classifying a light-emitting semiconductor component () for an image sensor application, wherein the semiconductor component () is designed as a light source for an image sensor (), comprising the following steps: providing the light-emitting semiconductor component (); determining at least one of the following parameters of the light emitted with an emission spectrum by the light-emitting semiconductor component () during operation: R=∫qR(λ)·S(λ)dλ·texp, G=∫qG(λ)·S(λ)dλ·texp, B=∫qB(λ)·S(λ)dλ·texp, wherein qR(λ), qG(λ), and qB(λ) are spectral sensitivities of a red, green, and blue color channel of the image sensor (), S(λ) is the emission spectrum of the light-emitting semiconductor component (), texp is an exposure time, and λ designates a wavelength; classifying the light-emitting semiconductor component () into a class from a group of classes, which are characterized by different value ranges of at least one parameter that depends on at least one of the parameters R, G, and B. The invention further relates to an image sensor application.