The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 04, 2022

Filed:

Sep. 10, 2019
Applicants:

Beijing Boe Optoelectronics Technology Co., Ltd., Beijing, CN;

Boe Technology Group Co., Ltd., Beijing, CN;

Inventors:

Yufeng Du, Beijing, CN;

Jiaxing Chen, Beijing, CN;

Tong Li, Beijing, CN;

Yufei Liu, Beijing, CN;

Litao Fan, Beijing, CN;

Hongyang Yu, Beijing, CN;

Guangzhao Yang, Beijing, CN;

Shuang Shi, Beijing, CN;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 5/00 (2006.01); A61B 5/145 (2006.01); A61B 5/157 (2006.01); A61B 5/15 (2006.01); G06F 1/16 (2006.01);
U.S. Cl.
CPC ...
A61B 5/681 (2013.01); A61B 5/14532 (2013.01); A61B 5/15 (2013.01); A61B 5/157 (2013.01); A61B 5/6824 (2013.01); A61B 5/742 (2013.01); G06F 1/163 (2013.01); G06F 1/1684 (2013.01);
Abstract

A detection device is provided and the detection device includes: a body, including a first groove and a first opening; the first opening is on a first surface of the body and in communication with the first groove; a collector, configured to be at least partially accommodated into the first groove in a rotatable manner and being capable of rotating to allow at least part of the collector to extend out of the first opening in a process of detection; a test paper supplier, disposed on the first surface and configured to provide a test paper on a side of the first opening away from the first groove in the process of detection so as to collect a detection sample; and a detector, disposed on the first surface and configured to detect the test paper that has collected the detection sample.


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