The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 04, 2022
Filed:
Jun. 29, 2017
Applicant:
Koninklijke Philips N.v., Eindhoven, NL;
Inventors:
Dominik Benjamin Kutra, Karlsruhe, DE;
Thomas Buelow, Grosshansdorf, DE;
Joerg Sabczynski, Norderstedt, DE;
Kirsten Regina Meetz, Hamburg, DE;
Assignee:
KONINKLIJKE PHILIPS N.V., Eindhoven, NL;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 5/00 (2006.01); G16H 10/60 (2018.01); G16H 30/20 (2018.01); A61B 5/055 (2006.01); G06T 7/00 (2017.01); A61B 6/00 (2006.01);
U.S. Cl.
CPC ...
A61B 5/4312 (2013.01); G06T 7/0012 (2013.01); G16H 10/60 (2018.01); G16H 30/20 (2018.01); A61B 5/055 (2013.01); A61B 6/502 (2013.01); A61B 6/5205 (2013.01); A61B 6/5211 (2013.01); A61B 2576/02 (2013.01);
Abstract
An image processing system, comprising an input interface (IN) for receiving a plurality of input images acquired of test objects. The system further comprises a material type analyzer (MTA) configured to produce material type readings at corresponding locations across said input images (IM(CH)). A statistical module (SM) of the system is configured to determine based on said readings an estimate for a probability distribution of material type for said corresponding locations.