The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 28, 2021
Filed:
Feb. 25, 2020
Applicant:
Rapiscan Systems, Inc., Torrance, CA (US);
Inventors:
Paul De Antonis, Horsham, GB;
Edward James Morton, Guildford, GB;
Russell David Luggar, Dorking, GB;
Assignee:
Rapiscan Systems, Inc., Torrance, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H05G 1/56 (2006.01); H01J 35/06 (2006.01); H01J 35/04 (2006.01); H01J 35/14 (2006.01); H05G 1/70 (2006.01); H05G 1/52 (2006.01); H05G 1/30 (2006.01); H05G 1/08 (2006.01);
U.S. Cl.
CPC ...
H05G 1/56 (2013.01); H01J 35/045 (2013.01); H01J 35/064 (2019.05); H01J 35/14 (2013.01); H01J 2235/023 (2013.01); H05G 1/085 (2013.01); H05G 1/30 (2013.01); H05G 1/52 (2013.01); H05G 1/70 (2013.01);
Abstract
An improved X-ray source is disclosed. The improved X-ray source has an enclosure, electron guns, a first set of address lines extending through the enclosure, a second set of address lines extending through the enclosure, and nodes defined by the intersection of the first and second set of address lines. Each of the electron guns is coupled to one of the nodes such that a state of each electron gun is uniquely controlled by modulating a state of one of the first set of address lines and one of the second set of address lines.