The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 28, 2021

Filed:

Jan. 19, 2017
Applicant:

Zivid Labs As, Oslo, NO;

Inventors:

Oystein Skotheim, Trondheim, NO;

Henrik Schumann-Olsen, Oslo, NO;

Assignee:

Zivid AS, Oslo, NO;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 13/204 (2018.01); H04N 13/257 (2018.01); H04N 5/225 (2006.01); H04N 9/04 (2006.01); H04N 9/09 (2006.01); H04N 13/00 (2018.01);
U.S. Cl.
CPC ...
H04N 13/204 (2018.05); H04N 5/2256 (2013.01); H04N 5/2258 (2013.01); H04N 9/0455 (2018.08); H04N 9/09 (2013.01); H04N 13/257 (2018.05); H04N 2013/0081 (2013.01);
Abstract

Imaging unit for obtaining a three-dimensional image of an object area, comprising an image sensor constituted by a matrix of sensor elements and a focusing unit for providing an image of said object area on the image sensor, the matrix being covered by a color filter array, and a projection unit for projecting a predetermined pattern toward the object area, the focusing unit and the projection unit having optical axes differing with a known angle, wherein the projection unit is adapted to project a time sequence of patterns toward the object area, the pattern sequence being chosen so as to uniquely define a position along at least one axis perpendicular to the projection axis, over the period defined by the illumination, wherein each sensor element in said matrix is connected to a processing branch adapted to detect the variations in the illumination sequence measured at each sensor element, and calculating from the known angle between the projection and imaging axes, the position in the sensor matrix, and the illumination sequence detected at each sensor element, a three-dimensional coordinate of the imaged point on the surface of the object, and wherein the processing branch is adapted to sample at least one image of said image area and calculate a color image based on said color filter pattern for said at least one image.


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