The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 28, 2021
Filed:
Oct. 27, 2017
Leica Geosystems Ag, Heerbrugg, CH;
Christoph Herbst, Dornbirn, AT;
LEICA GEOSYSTEMS AG, Heerbrugg, CH;
Abstract
Method for visually representing scanning data, which are composed of a multiplicity of individual measurement data. The individual measurement data in each case have at least one measurement value that is linked to a respective measurement direction, wherein the measurement directions are different from one another such that a predetermined scanning region with a predetermined scanning resolution is covered. The representation of the scanning data is effected by way of an image map with a number of map points that is dependent on a predetermined display resolution and by way of an assignment rule for assigning measurement value to map point, wherein the assignment is effected immediately on the basis of the respective measurement direction that is linked to the measurement value.