The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 28, 2021

Filed:

Jun. 26, 2020
Applicant:

Rohde & Schwarz Gmbh & Co. KG, Munich, DE;

Inventor:

Torsten Schorr, Munich, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 27/36 (2006.01); H04B 17/00 (2015.01); H04L 27/26 (2006.01); H04B 17/11 (2015.01);
U.S. Cl.
CPC ...
H04L 27/364 (2013.01); H04B 17/0085 (2013.01); H04B 17/11 (2015.01); H04L 27/2626 (2013.01); H04L 27/2666 (2013.01);
Abstract

A calibration method for calibrating an electronic device is described. The method comprises: generating a test signal having a predefined bandwidth, said test signal comprising an asymmetric signal component being asymmetric in frequency domain, and said test signal further comprising a symmetric signal component being symmetric in frequency domain; processing said test signal via said electronic device, thereby generating a response signal of said electronic device to said test signal; analyzing said response signal, thereby generating measurement data comprising information on impairments due to at least one of a frequency selective channel of said electronic device and an IQ mismatch of said electronic device; and adapting at least one operational parameter of said electronic device based on said measurement data in order to calibrate the electronic device. Further, a calibration system is described.


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