The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 28, 2021
Filed:
Dec. 15, 2016
China Communication Technology Co., Ltd., Guangdong, CN;
Shenzhen Institute of Terahertz Technology and Innovation, Guangdong, CN;
Zhihui Feng, Guangdong, CN;
Chunchao Qi, Guangdong, CN;
Hanjiang Chen, Guangdong, CN;
Rong Wang, Guangdong, CN;
Shukai Zhao, Guangdong, CN;
CHINA COMMUNICATION TECHNOLOGY CO., LTD., Guangdong, CN;
Shenzhen Institute of Terahertz Technology and Innovation, Shenzhen, CN;
Abstract
An electrically scanned array antenna device applied to a millimeter wave imaging system is provided. The electrically scanned array antenna device comprises an adjustable light source for outputting an optical signal with an adjustable wavelength; an electro-optical modulation module; an optocouple; a time delay module for performing optical delay of different duration on each modulated signal, and correspondingly changing the duration of the optical delay according to the wavelength of the optical signal to obtain modulated signals of different phases; an optical detector; and an array antenna. The millimeter wave is loaded on the optical signal with an adjustable wavelength to obtain a modulated signal; the modulated signal is divided into multiple signals; time delay of different duration is performed on each signal; and millimeter wave signals of different phases are obtained after demodulation and are simultaneously transmitted to scan an object to be measured.