The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 28, 2021

Filed:

Oct. 05, 2020
Applicant:

Futurewei Technologies, Inc., Plano, TX (US);

Inventors:

Ping Shi, Santa Clara, CA (US);

Yonghua Wei, Santa Clara, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03H 7/40 (2006.01); H01Q 1/50 (2006.01); H04B 17/10 (2015.01); H04B 17/12 (2015.01); H04B 17/19 (2015.01); H04B 17/18 (2015.01);
U.S. Cl.
CPC ...
H01Q 1/50 (2013.01); H04B 17/102 (2015.01); H04B 17/12 (2015.01); H04B 17/103 (2015.01); H04B 17/18 (2015.01); H04B 17/19 (2015.01);
Abstract

An apparatus comprises a radio frequency (RF) antenna circuit; an antenna aperture tuning circuit; an antenna impedance measurement circuit; and a processor circuit electrically coupled to the tunable antenna aperture circuit and the impedance measurement circuit. The processor circuit is configured to: set the antenna aperture tuning circuit to an antenna aperture tuning state according to one or more parameters of an RF communication network; initiate an antenna impedance measurement; and change the antenna aperture tuning state to an antenna aperture tuning state indicated by the antenna impedance.


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