The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 28, 2021

Filed:

Sep. 11, 2015
Applicant:

Indiana University Research and Technology Corporation, Indianapolis, IN (US);

Inventors:

Todd O. McKinley, Indianapolis, IN (US);

Scott D. Steenburg, Zionsville, IN (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G16H 50/20 (2018.01); G16H 50/30 (2018.01); G16H 30/40 (2018.01);
U.S. Cl.
CPC ...
G16H 50/20 (2018.01); G16H 30/40 (2018.01); G16H 50/30 (2018.01);
Abstract

Example embodiments are described that relate to the analysis of tissue damage in an injured patient. Example embodiments are methods and systems for collecting medical imaging data, identifying tissue damage in the medical imaging data, analyzing the tissue damage shown in the medical imaging data, and/or quantifying the tissue damage shown in the medical imaging data. The disclosed methods allow for determining a risk for multiple organ failure and systemic inflammation in a multiply injured patient.


Find Patent Forward Citations

McKinley, Todd. (2021). Methods and systems for tissue damage identification and quantification (U.S. Patent No. 11211166). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11211166

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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