The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 28, 2021

Filed:

Sep. 16, 2019
Applicant:

Wuhan Jingce Electronic Group Co., Ltd., Wuhan, CN;

Inventors:

Zengqiang Zheng, Wuhan, CN;

Li Qin, Wuhan, CN;

Zhao Liu, Wuhan, CN;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G09G 3/20 (2006.01);
U.S. Cl.
CPC ...
G09G 3/20 (2013.01); G09G 2320/0233 (2013.01); G09G 2320/0285 (2013.01); G09G 2320/0626 (2013.01); G09G 2360/16 (2013.01);
Abstract

A method of Mura defect repair, the method including: decoding an image input signal into pixel grayscale data of a frame image; looking up a DeMura lookup table and DeMura control data, and performing linear interpolation on Mura designated areas of the frame image according to the DeMura lookup table and DeMura control data to obtain compensation data of the Mura designated areas of the frame image; and superposing the compensation data and the pixel grayscale data of the frame image to obtain a compensated frame image signal.


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Zheng, Zengqiang. (2021). Method and device for mura defect repair (U.S. Patent No. 11210982). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11210982

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