The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 28, 2021
Filed:
Mar. 01, 2021
Carl Zeiss Meditec Ag, Jena, DE;
Carl Zeiss Meditec AG, Jena, DE;
Abstract
A computer-implemented method for locating possible artifacts in a virtually stained histology image, which was obtained from an initial histology image, is provided. In the method, at least one further image is generated on the basis of the virtually stained histology image or the initial histology image. The differences between the at least one further image and the virtually stained histology image are determined when the at least one further image has been generated on the basis of the initial histology image or the differences between the at least one further image and the initial histology image are determined when the at least one further image has been generated on the basis of the virtually stained histology image, and a mapping from the determined differences to their positions in the virtually stained histology image is created. The positions in the virtually stained histology image represent the positions of possible artifacts.