The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 28, 2021
Filed:
Oct. 18, 2019
Canon Kabushiki Kaisha, Tokyo, JP;
Kei Watanabe, Tokyo, JP;
Canon Kabushiki Kaisha, Tokyo, JP;
Abstract
An image processing apparatus includes an identifiability value obtaining portion, an inspection region generation portion, and an image inspection portion. The identifiability value obtaining portion is configured to obtain, for each pixel address constituting an image plane, an identifiability value for identifying which of a first inspection result and a second inspection result the pixel address corresponds to. The inspection region generation portion is configured to generate an inspection region serving as a target of image processing by setting a portion of the image plane including the pixel address where the obtained identifiability value satisfies a specific condition as the inspection region. The image inspection portion is configured to perform image processing for inspection on a partial image corresponding to the inspection region among a third image obtained by imaging a third target object.