The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 28, 2021
Filed:
Mar. 15, 2019
Hitachi, Ltd., Tokyo, JP;
Maria Teresa Gonzalez Diaz, Mountain View, CA (US);
Dipanjan Ghosh, Santa Clara, CA (US);
Adriano Arantes, San Jose, CA (US);
Michiko Yoshida, San Jose, CA (US);
Jiro Hashizume, San Jose, CA (US);
Chetan Gupta, San Mateo, CA (US);
Phawis Thammasorn, Fayetteville, AR (US);
Hitachi, Ltd., Tokyo, JP;
Abstract
Example implementations described herein involve defect analysis for images received from a camera system, which can involve applying a first model configured to determine regions of interest of the object from the images, applying a second model configured to identify localized areas of the object based on the regions of interest on the images; and applying a third model configured to identify defects in the localized ones of the images.