The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 28, 2021
Filed:
Jan. 06, 2020
International Business Machines Corporation, Armonk, NY (US);
Ying Zhao Guo, Palatine, IL (US);
Jason Resch, Chicago, IL (US);
Niall John McShane, Chicago, IL (US);
Akiko Sato, Palatine, IL (US);
Patrick Aaron Tamborski, Chicago, IL (US);
Gregory A. Papadopoulos, Hickory Hills, IL (US);
Praveen Viraraghavan, Chicago, IL (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A failure detection and correction module (FDCM) uses statistical measurement to detect failures in a distributed computing system caused by hardware, software, workflow, deployment, environmental factors, etc. in a component of the computing system, the computing system, or multiple computing systems and produces corrective actions. The FDCM identifies issues from various components, correlates the estimated failures in each level of components and rolls up failures and estimated failures from each level of components to system level estimations of failures, reevaluates the system reliability factors, readjusts the system reliability and system functions from the adjusted reliability factors, and produces intelligent corrective actions to improve both system reliability and the system efficiency. Corrective action includes changing slice storing parameters and rebuild priorities on a dispersed storage system.