The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 28, 2021

Filed:

Nov. 16, 2018
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Uttam Thakore, Urbana, IL (US);

HariGovind Venkatraj Ramasamy, Round Rock, TX (US);

Yu Gu, Austin, TX (US);

Mahesh Viswanathan, Yorktown Heights, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 16/25 (2019.01); G06F 16/901 (2019.01);
U.S. Cl.
CPC ...
G06F 11/004 (2013.01); G06F 16/258 (2019.01); G06F 16/9024 (2019.01); G06F 2201/86 (2013.01);
Abstract

A method, computer program product, and computer system for prioritization of data collection and analysis for incident detection. Data points within a plurality of monitor data corresponding to effects of incidents may be identified by a computing device. The plurality of monitor data may be converted to a set of time series extracted from the plurality of monitor data. The set of time series may be aligned and summarized. A causal relationship graph may be constructed between the set of time series extracted from the plurality of monitor data. Features may be prioritized by likelihood of importance in incident analysis based upon, at least in part, the causal relationship graph.


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