The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 28, 2021
Filed:
Sep. 01, 2017
Mitsubishi Hitachi Power Systems, Ltd., Kanagawa, JP;
Masato Shida, Kanagawa, JP;
Yukihiko Inoue, Tokyo, JP;
Kuniaki Aoyama, Tokyo, JP;
Ichiro Nagano, Kanagawa, JP;
Shun Niizuma, Tokyo, JP;
Tomohiro Baba, Kanagawa, JP;
Akihisa Endo, Kanagawa, JP;
Takahiro Yamauchi, Kanagawa, JP;
Tsuyoshi Kinoshita, Kanagawa, JP;
Shinsaku Endo, Kanagawa, JP;
Yasuoki Tomita, Kanagawa, JP;
Katsuhiko Abe, Kanagawa, JP;
MITSUBISHI POWER, LTD., Kanagawa, JP;
Abstract
A diagnostic device includes a storage unit that stores first information including a first abnormal event which occurred in the past in a plant, a first attribution event that is a cause of the first abnormal event, and a first occurrence probability of the first attribution event, in which a causal relationship between the first abnormal and attribution events is indicated by a tree structure, and second information including a second abnormal event which is supposed to occur in the plant but has not yet occurred, a second attribution event that is a cause of the second abnormal event, and a second occurrence probability of the second attribution event, in which a causal relationship between the second abnormal and attribution events is indicated by a tree structure; and an estimation unit that estimates the cause of the sign of the abnormality, based on the first and second information.