The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 28, 2021

Filed:

Jan. 25, 2019
Applicant:

GE Inspection Technologies, Lp, Lewistown, PA (US);

Inventors:

Arun Karthi Subramaniyan, Danville, CA (US);

Michael Kennedy, Moraga, CA (US);

Haiming Zhao, San Ramon, CA (US);

Fabio Nonato de Paula, Livermore, CA (US);

Imran Younus, Lewistown, PA (US);

Assignee:

GE INSPECTION TECHNOLOGIES, LP, Lewistown, PA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G05B 23/02 (2006.01); G06N 5/02 (2006.01); G06N 20/00 (2019.01); G05B 13/04 (2006.01); G05B 17/02 (2006.01);
U.S. Cl.
CPC ...
G05B 23/0221 (2013.01); G05B 13/048 (2013.01); G05B 23/0224 (2013.01); G05B 23/0243 (2013.01); G05B 23/0272 (2013.01); G06N 5/025 (2013.01); G06N 20/00 (2019.01); G05B 17/02 (2013.01);
Abstract

A method includes receiving a first time-dependent data characterizing measurement by a first sensor operatively coupled to an oil and gas industrial machine; determining a first anomaly score associated with a first portion of the first time-dependent data over a time period, the determination is based on a first value of an operating characteristic over the time period and a second value of the operating characteristic over the time period, wherein the first value of the operating characteristic is calculated from the first time-dependent data and the second value of the operating characteristic is detected at the oil and gas industrial machine; and rendering, in a graphical user interface display space, a visual representation indicative of the first anomaly score. Related apparatus, systems, articles, and techniques are also described.


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