The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 28, 2021
Filed:
Jan. 10, 2019
Fanuc Corporation, Yamanashi, JP;
Susumu Maekawa, Yamanashi, JP;
Hirohide Tsunoda, Yamanashi, JP;
FANUC CORPORATION, Yamanashi, JP;
Abstract
To provide an abnormality determination apparatus, a computer readable medium, an abnormality determination system and an abnormality determination method which can simply detect an abnormality of a temperature in a machine tool without incurring cost. An abnormality determination apparatus which determines abnormality of a temperature sensor in a plurality of machine tools, in which the plurality of machine tools is equivalent machine type, is arranged in equivalent environments, are provided with a temperature sensor at equivalent positions, the abnormality determination apparatus including: a temperature data acquisition unit which acquires temperature data outputted by the temperature sensors from each of the plurality of machine tools; a comparison unit which compares the temperature data acquired by the temperature data acquisition unit; and an abnormality determination unit which determines abnormality of the temperature sensor based on a comparison result by the comparison unit.