The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 28, 2021

Filed:

Sep. 06, 2019
Applicant:

Fujifilm Corporation, Tokyo, JP;

Inventor:

Kenta Matsubara, Ashigarakami-gun, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/06 (2006.01); G02B 21/12 (2006.01); G02B 21/00 (2006.01);
U.S. Cl.
CPC ...
G02B 21/12 (2013.01); G02B 21/008 (2013.01); G02B 21/0032 (2013.01); G02B 21/0036 (2013.01); G02B 21/0076 (2013.01);
Abstract

An observation device includes: a stage on which a vessel in which a subject is stored is installed; an image-forming optical system that includes an objective lens forming an image of the subject stored in the vessel; a scan control unit that moves the stage with respect to the image-forming optical system to scan each observation position in the vessel by the image-forming optical system; and an acceleration-determination-information acquisition unit that acquires at least one piece of information among information about the subject, information about the vessel, information about an observation method, or information about an observation condition. The scan control unit controls an acceleration of the stage on the basis of the at least one piece of information.


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