The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 28, 2021
Filed:
Jun. 23, 2020
Nanchang Hangkong University, Nanchang, CN;
Bin Liu, Nanchang, CN;
Wei Luo, Nanchang, CN;
Qiang Wu, Nanchang, CN;
Juan Liu, Nanchang, CN;
Shengpeng Wan, Nanchang, CN;
Xingdao He, Nanchang, CN;
NANCHANG HANGKONG UNIVERSITY, Nanchang, CN;
Abstract
The present invention provides a tapered side-polished fiber-optic biosensor (FOBS) and a method for preparing a tapered side-polished fiber (SPF). The biosensor includes a broadband light source, a first single-mode fiber, a tapered SPF, a second single-mode fiber, and a spectrometer. The broadband light source is connected to the tapered SPF through the first single-mode fiber, and the tapered SPF is connected to the spectrometer through the second single-mode fiber. The broadband light source is configured to emit a light wave. The spectrometer is configured to display a spectrum corresponding to a light wave passing through the first single-mode fiber, the tapered SPF, and the second single-mode fiber successively. In the present invention, a fiber side-polishing technology is combined with a fiber tapering technology to construct a tapered SPF, and a spectrum changes by changing a refractive index around a side-polished tapered region, thereby measuring the refractive index. In addition, the tapered SPF provided in the present invention can generate a Vernier effect, thereby improving the sensor's anti-electromagnetic interference and sensitivity to refractive index measurement.