The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 28, 2021

Filed:

Dec. 10, 2015
Applicant:

Surf Technology As, Trondheim, NO;

Inventor:

Bjørn Angelsen, Trondheim, NO;

Assignee:

SURF TECHNOLOGY AS, Trondheim, NO;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01S 7/52 (2006.01); G01S 15/89 (2006.01); A61B 5/00 (2006.01); G01S 7/41 (2006.01); G01S 7/48 (2006.01);
U.S. Cl.
CPC ...
G01S 7/52038 (2013.01); G01S 15/8929 (2013.01); G01S 15/8952 (2013.01); A61B 5/0059 (2013.01); G01S 7/41 (2013.01); G01S 7/4802 (2013.01);
Abstract

1and 2pulsed waves () with 1and 2center frequencies are transmitted along 1and 2transmit beams so that the 1and 2pulsed waves overlap at least in an overlap region (Z) to produce nonlinear interaction scattering sources in said region. The scattered signal components from at least the nonlinear interaction scattering sources are picked up by a receiver () and processed to suppress other components than said nonlinear interaction scattered signal components, to provide nonlinear interaction measurement or image signals. At least a receive beam is scanned in an azimuth or combined azimuth and elevation direction to produce 2D or 3D images of said nonlinear interaction scattering sources.


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