The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 28, 2021

Filed:

Dec. 27, 2018
Applicant:

Schneider Electric Usa, Inc., Andover, MA (US);

Inventors:

Jon A. Bickel, Murfreesboro, TN (US);

Aaron M. Dudley, Murfreesboro, TN (US);

Theresa K. Wall, Murfreesboro, TN (US);

Assignee:

Schneider Electric USA, Inc., Boston, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 21/133 (2006.01); G01R 19/25 (2006.01); G01R 22/10 (2006.01); G06F 17/00 (2019.01);
U.S. Cl.
CPC ...
G01R 21/133 (2013.01); G01R 19/2513 (2013.01); G01R 22/10 (2013.01); G06F 17/00 (2013.01);
Abstract

A method for quantifying power quality events in an electrical system including a plurality of intelligent electronic devices (IEDs) includes processing electrical measurement data from or derived from energy-related signals captured by at least one first IED of the plurality of IEDs to identify a power quality event at a first point of installation of the at least one first IED in the electrical system. An impact of the power quality event at a second point of installation in the electrical system is determined based on an evaluation of electrical measurement data from or derived from energy-related signals captured by at least one second IED of the plurality of IEDs at the second point of installation proximate to a determined time of occurrence of the power quality event at the first point of installation.


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