The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 28, 2021

Filed:

Jan. 19, 2017
Applicant:

Hitachi High-technologies Corporation, Tokyo, JP;

Inventors:

Kohei Kinugawa, Tokyo, JP;

Katsuhiro Kambara, Tokyo, JP;

Toshiki Yamagata, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 35/04 (2006.01); G01N 35/02 (2006.01); G01N 35/00 (2006.01);
U.S. Cl.
CPC ...
G01N 35/04 (2013.01); G01N 35/00584 (2013.01); G01N 35/02 (2013.01); G01N 2035/0462 (2013.01);
Abstract

A specimen inspection automation system includes holder orientation adjustment mechanisms that adjust the orientations of specimen container holders that each holds one specimen container. The holder orientation adjustment mechanisms each includes: a stopper mechanism that is disposed above a conveyance line that conveys a specimen container holder and restricts the downstream movement of the specimen container holder by abutting, at the same height as a notched part provided on one side of a base of the specimen container holder, an outer circumferential part other than the notched part in the circumferential direction of the base; and a holder rotation mechanism that restricts the movement of the specimen container holder away from the stopper mechanism and rotates the specimen container holder in the circumferential direction. As a result, it is possible to appropriately adjust the orientation of a specimen container in which a specimen is accommodated and reduce work complexity.


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