The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 28, 2021

Filed:

Nov. 12, 2020
Applicant:

Shanghai Agrobiological Gene Center, Shanghai, CN;

Inventors:

Hanwei Mei, Shanghai, CN;

Qiaojun Lou, Shanghai, CN;

Ming Yan, Shanghai, CN;

Fangjun Feng, Shanghai, CN;

Huan Gao, Shanghai, CN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/00 (2006.01); G01N 33/00 (2006.01); G01N 21/39 (2006.01); G01N 21/84 (2006.01);
U.S. Cl.
CPC ...
G01N 33/0098 (2013.01); G01N 21/39 (2013.01); G01N 21/84 (2013.01); G01N 2021/8444 (2013.01); G01N 2021/8466 (2013.01);
Abstract

Provided is a system for detection and analysis of a fibrous root system architecture of a plant, including a plant pot having at least one slit area extending through a cross section in an axial direction, at least one laser measuring unit, and a data analyzing unit, where each laser measuring unit has a laser transmitter and a receiver disposed corresponding to the slit area in such a manner that a laser beam emitted from the laser transmitter to the receiver goes across the cross section of the plant pot; measurement on all roots in the slit area is realized by a rotating stage, and the laser measuring unit swinging horizontally around the laser transmitter within a predetermined angle range; and the data analyzing unit is configured to perform statistical analysis on the roots of a plant to be measured according to laser measuring results.


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