The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 28, 2021
Filed:
Apr. 27, 2017
Shimadzu Corporation, Kyoto, JP;
Toshinobu Yanagisawa, Kyoto, JP;
Kanta Horie, Ibaraki, JP;
Shimadzu Corporation, Kyoto, JP;
Abstract
A data processing device that processes three-dimensional data having time, intensity, and wavelength collected from a sample serving as a measurement target includes: a chromatogram generator configured to generate a chromatogram from the three-dimensional data; a target peak determiner configured to determine a target peak from peaks appearing on the chromatogram; a time point specifier configured to specify a time point at which the size of a spectrum matches the size of a reference spectrum from a time range during which the target peak appears in the three-dimensional data; and a target spectrum generator configured to extract data at the time point from the three-dimensional data, thereby generating a spectrum at the time point. With this configuration, a spectrum that is not affected by distortion, saturation, or noise can be readily and reliably obtained from the three-dimensional data obtained through sample analysis.