The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 28, 2021
Filed:
May. 29, 2019
John S. Madsen, Commack, NY (US);
Jerrell A. Nardiello, Hicksville, NY (US);
Elias L. Anagnostou, Merrick, NY (US);
John A. Crawford, Miller Place, NY (US);
Stephen J. Engel, East Northport, NY (US);
John S. Madsen, Commack, NY (US);
Jerrell A. Nardiello, Hicksville, NY (US);
Elias L. Anagnostou, Merrick, NY (US);
John A. Crawford, Miller Place, NY (US);
Stephen J. Engel, East Northport, NY (US);
NORTHROP GRUMMAN SYSTEMS CORPORATION, Falls Church, VA (US);
Abstract
A system includes a void filter that receives sensor data employed to produce or inspect a manufactured part, the void filter generates a void data subset indicating voids detected in the manufactured part. A stress analyzer processes the void data subset from the void filter and determines coordinate data and force data for the respective detected voids in the manufactured part. At least one deterministic model analyzes the coordinate data and the force data from the stress analyzer determined for the detected voids from the void data subset. The deterministic model analyzes failure of the detected voids with respect to time and generates deterministic output data indicating failure over a deterministic timeframe. A prognostic analyzer processes the deterministic output data from the at least one deterministic model and generates a failure prediction for the as manufactured part.