The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 28, 2021

Filed:

Aug. 31, 2018
Applicant:

Tsubakimoto Chain Co., Osaka, JP;

Inventors:

Tomohiko Onishi, Osaka, JP;

Hirokazu Sano, Osaka, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B65G 43/02 (2006.01); B65G 43/00 (2006.01); B65G 17/38 (2006.01); B65G 23/06 (2006.01);
U.S. Cl.
CPC ...
B65G 43/02 (2013.01); B65G 17/38 (2013.01); B65G 23/06 (2013.01); B65G 2203/0275 (2013.01); B65G 2203/041 (2013.01); B65G 2203/042 (2013.01); B65G 2812/02099 (2013.01); B65G 2812/02287 (2013.01);
Abstract

Provided are an abnormality detection system, an abnormality detection device, an abnormality detection method, a computer program, and a chain that enable detecting of an abnormality not only in a chain but also in equipment using the chain while distinguishing the location at which the abnormality occurs. The abnormality detecting system comprises a sensor unit comprising a sensor, to be fixed to a chain that is to be attached to equipment, and transmitting an output from the sensor, a detection section which detects an abnormality of the chain or the equipment based on the output, and a determining section which determines a location of the abnormality in the equipment, based on a position of a part fixed with the sensor unit in the equipment, the position changes in each time point with moving of the chain.


Find Patent Forward Citations

Onishi, Tomohiko. (2021). Abnormality detecting system, abnormality detecting apparatus, abnormality detecting method, computer program, and chain (U.S. Patent No. 11208269). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11208269

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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