The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 28, 2021

Filed:

Feb. 14, 2019
Applicant:

GE Global Sourcing Llc, Norwalk, CT (US);

Inventors:

Ajith Kuttannair Kumar, Erie, PA (US);

Wolfgang Daum, Erie, PA (US);

Martin Paget, Irvine, CA (US);

Daniel Rush, Melbourne, FL (US);

Brad Thomas Costa, Melbourne, FL (US);

Seneca Snyder, Melbourne, FL (US);

Jerry Duncan, Melbourne, FL (US);

Mark Bradshaw Kraeling, Melbourne, FL (US);

Michael Scott Miner, Melbourne, FL (US);

Shannon Joseph Clouse, Erie, PA (US);

Anwarul Azam, Lawrence Park, PA (US);

Matthew Lawrence Blair, Lawrence Park, PA (US);

Nidhi Naithani, Bangalore, IN;

Dattaraj Jagdish Rao, Bangalore, IN;

Anju Bind, Bangalore, IN;

Sreyashi Dey Chaki, Bangalore, IN;

Scott Daniel Nelson, Melbourne, FL (US);

Nikhil Uday Naphade, Maharashtra, IN;

Wing Yeung Chung, Erie, PA (US);

Daniel Malachi Bellesty, Wattsburg, PA (US);

Glenn Robert Shaffer, Erie, PA (US);

Jeffrey James Kisak, Erie, PA (US);

Dale Martin DiDomenico, Melbourne, FL (US);

Suresh Govindappa, Lawrence Park, PA (US);

Manibabu Pippalla, Bangalore, IN;

Sethu Madhavan, Erie, PA (US);

Arunachala Karthik Sridharan, Bangalore, IN;

Prabhu Marimuthu, Chennai, IN;

Jared Klineman Cooper, Melbourne, FL (US);

Joseph Forrest Noffsinger, Lee's Summit, MO (US);

Paul Kenneth Houpt, Schenectady, NY (US);

David Lowell McKay, Melbourne, FL (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B61L 25/02 (2006.01); B61L 15/00 (2006.01); B61L 27/00 (2006.01); B64C 39/02 (2006.01); B64D 47/08 (2006.01); G06K 9/00 (2006.01); H04N 7/18 (2006.01); H04L 29/08 (2006.01); G05D 1/00 (2006.01); H04N 5/232 (2006.01); H04W 4/40 (2018.01); B61L 23/04 (2006.01); H04N 5/33 (2006.01);
U.S. Cl.
CPC ...
B61L 25/021 (2013.01); B61L 15/009 (2013.01); B61L 15/0027 (2013.01); B61L 15/0072 (2013.01); B61L 15/0081 (2013.01); B61L 25/023 (2013.01); B61L 25/025 (2013.01); B61L 25/026 (2013.01); B61L 27/0077 (2013.01); B61L 27/0088 (2013.01); B61L 27/0094 (2013.01); B64C 39/024 (2013.01); B64D 47/08 (2013.01); G05D 1/0094 (2013.01); G06K 9/00651 (2013.01); G06K 9/00771 (2013.01); G06K 9/00798 (2013.01); H04L 67/12 (2013.01); H04N 5/23203 (2013.01); H04N 5/23206 (2013.01); H04N 5/23241 (2013.01); H04N 7/183 (2013.01); H04W 4/40 (2018.02); B61L 23/04 (2013.01); B61L 2205/04 (2013.01); B64C 2201/123 (2013.01); B64C 2201/208 (2013.01); G06K 9/00805 (2013.01); H04N 5/332 (2013.01); H04N 7/185 (2013.01);
Abstract

System includes a controller configured to obtain one or more of a route parameter or a vehicle parameter from discrete examinations of one or more of a route or a vehicle system. The route parameter is indicative of a health of the route over which the vehicle system travels. The vehicle parameter is indicative of a health of the vehicle system. The discrete examinations of the one or more of the route or the vehicle system separated from each other by one or more of location or time. The controller is configured to examine the one or more of the route parameter or the vehicle parameter to determine whether the one or more of the route or the vehicle system is damaged. The system also includes examination equipment configured to continually monitor the one or more of the route or the vehicle system responsive to determining that the one or more of the route or the vehicle is damaged.


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