The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 28, 2021
Filed:
Jul. 24, 2018
Ruibo Wang, Oak Park, CA (US);
Pawel Adam Menzfeld, Thousand Oaks, CA (US);
James Frederick Gass, Camarillo, CA (US);
Ruibo Wang, Oak Park, CA (US);
Pawel Adam Menzfeld, Thousand Oaks, CA (US);
James Frederick Gass, Camarillo, CA (US);
OAK ANALYTICS INC, Camarillo, CA (US);
Abstract
An optical window for an imaging system such as a Raman spectrometer, NIR spectrometer, fluorometer, or hyperspectral camera is configured to contact the subject. It includes: a substrate; and a flexible medium, where the flexible medium is configured to be deformed with substantially the same profile as that of the outer surface of the subject. The refractive index of the flexible medium and substrate is selected such that light collection efficiency and/or imaging quality returned to the measurement system increases after application of the optical window.