The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 28, 2021
Filed:
Oct. 20, 2017
Applicant:
Samsung Electronics Co., Ltd., Suwon-si, KR;
Inventors:
Dong-wook Kim, Yongin-si, KR;
Min-cheol Park, Bucheon-si, KR;
Assignee:
SAMSUNG ELECTRONICS CO., LTD., Suwon-si, KR;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 6/00 (2006.01); A61B 6/06 (2006.01);
U.S. Cl.
CPC ...
A61B 6/548 (2013.01); A61B 6/4417 (2013.01); A61B 6/4452 (2013.01); A61B 6/4464 (2013.01); A61B 6/461 (2013.01); A61B 6/587 (2013.01); A61B 6/06 (2013.01);
Abstract
A method of controlling an X-ray image capturing apparatus, including acquiring, using a camera, a first image by photographing a detector configured to receive X-rays emitted from an X-ray emission surface, generating a second image by performing a correction on the first image, wherein the correction includes changing a first detector shape in the first image to match a second detector shape photographed in a direction perpendicular to the X-ray emission surface, and displaying the second image.