The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 21, 2021
Filed:
Jul. 26, 2018
Micromass Uk Limited, Wilmslow, GB;
Anatoly Verenchikov, Bar, ME;
Micromass UK Limited, Wilmslow, GB;
Abstract
An improved multi-pass time-of-flight or electrostatic trap mass spectrometer () with an orthogonal accelerator, applicable to mirror based multi-reflecting (MR) or multi-turn (MT) analyzers. The orthogonal accelerator () is tilted and after first ion reflection or turn the ion packets are back deflected with a compensated deflector () by the same angle α to compensate for the time-front steering and for the chromatic angular spreads. The focal distance of deflector () is control by Matsuda plates or other means for producing quadrupolar field in the deflector. Interference with the detector rim is improved with dual deflector (). The proposed improvements allow substantial extension of flight path and number of ion turns or reflections. The problems of analyzer angular misalignments by tilting of ion mirror () is compensated by electrical adjustments of ion beam () energy and deflection angles in deflectors () and ().